Gregor Öhl

Philipps-Universität Marburg

Department of Physics

Renthof 5, 35032 Marburg
Phone: +49 6421 28-24234
Fax: +49 6421 28-24218
Email: gregor.oehl@physik.uni-marburg.de

Curriculum Vitae (excerpt)

Born

June 12th, 1979   in Neustadt (Weinstraße), Germany

Military service

1998-1999 in Mayen and Andernach

Education

1999-2005

Georg-August-University, Göttingen Education in Physics
Language courses in French, Portuguese, Spanish
Courses in Musicology

11/2005

Diploma in Physics, II. Physikalisches Institut, University of Göttingen in the group of H. Hofsäss
diploma thesis entitled „Cathodoluminescence studies on the energy transfer between Lanthanide ions in aluminium nitride“

2001-2002

ERASMUS-student in Lisbon, Portugal at the Faculdade de Ciências da Universidade de Lisboa (Physics), the Faculdade de Letras da Universidade de Lisboa (Portuguese),
and the Instituto Tecnológico e Nuclear (IBA-lab and ANN-project (see publications))

2006-now

post-graduate student at the University of Marburg in the Surface Spectroscopy group (Dep. of Physics) of P. Jakob

since
03/2007

fellow of the Graduate College Electron – Electron Interactions in Solids

Summerschools

05/2002      ERASMUS Intensive Programme Thin films and multilayers as seen by local probes in Uppsala, Sweden

09/2006      International Wilhelm and Else Heraeus Summerschool on Nanomagnetism in Rauischholzhausen, Germany

Languages

German
English
French
Portuguese
Spanish

Publications

U. Vetter, J. B. Gruber, A. S. Nijjar, B. Zandi, G. Öhl, U. Wahl, B. De Vries, H. Hofsäss, M. Dietrich and the ISOLDE Collaboration

Crystal field analysis of Pm3+ (4f4) and Sm3+ (4f5) and lattice location studies of 147Nd and 147Pm in w-AlN
Phys. Rev. B 74, 205201 (2006)

N.P. Barradas, A. Vieira, V. Matias, G. Öhl, J.C. Soares, S. Cardoso, P.P. Freitas
Development of artificial neural networks for thin AlxNyOz films measured by Rutherford backscattering
IAEA TECDOC-1409 (2004) 29-36

G. Öhl, V. Matias, A.Vieira, N.P. Barradas
Artificial neural network analysis of RBS data with roughness: Application to Ti0.4Al0.6N/Mo multilayers
NIM B 211 (2003) 265-273

V. Matias, G. Öhl, J.C. Soares, N.P. Barradas
Determination of the composition of light thin films with artificial neural network analysis of Rutherford backscattering experiments
Phys. Rev. E 67, 046705 (2003)

Talks and Posters @ Conferences

G. Öhl, U. Vetter, P. Jakob
Anlage zur Deposition und Charakterisierung organischer Heterostrukturen unter XHV-Bedingungen (poster)
Seminar of the International Research Training Group Electron-Electron Interactions in Solids in Riezlern, Austria, 28.08. – 02.09.2006

G. Öhl, U. Vetter, H. Hofsäss
Optical properties and energy transfer studies of AlN doped with rare earths at high concentrations (talk)
DPG Spring Meeting, HL, Dresden, Germany, March 2006

G. Öhl, U. Vetter, H. Hofsäss
Optical and magnetic properties of rare earth implanted AlN
DPG, 69th annual meeting, HL 43.2, Berlin, Germany, March 2005

G. Öhl, V. Matias, C.J. Tavares, L. Rebouta, E. Alves, A. Vieira, N.P. Barradas
Rutherford Backscattering analysis of roughness in TiAlN/Mo multilayers with artificial neural networks (poster)
EPS-12, General Conference: Trends in Physics, P1-101-C, Budapest, Hungary, August 2002